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論文

論文題目 作者 刊物名稱 發(fā)表年度
A novel mask structure for measuring the defocus of scanner 董立松; SPIE Advanced Lithography，International Society for Optics and Photonics 2016
String Select Transistor Leakage Suppression By Threshold Voltage Modulation In 3DNAND Flash Memory 鄒興奇; 2016 IEEE 13th International Conference on Solid-State and Integrated Circuit Technology 2016
Design technology co-optimization for N14 Metal1 layer 段英麗; 2016 China Semiconductor Technology International Conference (CSTIC) 2016
Effective solution for the 14nm node multiple patterning lithography 于麗賢; 2016 China Semiconductor Technology International Conference (CSTIC) 2016
Defect engineering for shallow n‐type junctions in germanium: Facts and fiction Eddy Simoen; physica status solidi (a) 2016
Performance Enhancement of Metal Floating Gate Memory By Using a Bandgap Engineered High-k Tunneling Barrier 姜丹丹; ECS Transactions 2016
一種對稱式雙光柵干涉位移測量系統(tǒng)的研制 高金磊; 中國激光 2016
Schottky Barrier Height Tuning via the Dopant Segregation Technique through Low-Temperature Microwave Annealing 羅軍; Materials 2016
Impact of the Effective Work Function Gate Metal on the Low-Frequency Noise of Gate-All-Around Silicon-on-Insulator NWFETs 方雯; IEEE Eletrcon Device Letters 2016
Random telegraph noise: the key to single defect studies in nano-devices Eddy Simoen; Thin Solid Films 2016
Low-frequency noise spectroscopy of bulk and border traps in nanoscale devices Eddy Simoen; Solid state Phenomena 2016
Study Of RBSOA Reliability Of Nanoscale Partially Narrow Mesa IGBT (PNM-IGBT) 陸江; International Conference on Solid-State and Integrated Circuit Technology (ICSICT) 2016
Failure Analysis of the VDMOS Device with VSD and RDS (on) Exceeded Limit Based on Reliability Physics 李慶; Prognostics and System Health Management Conference 2016
Bonding Degradation Modeling for High-power Semiconductors ; 第二屆國際高壓直流會議HVDC 2016
A Simulation Model for the PN Junction Based on SOI 卜建輝; International Conference on Solid-State and Integrated Circuit Technology 2016